Bulk morphology of porous materials at submicrometer scale studied by dark-field x-ray imaging with Hartmann masks
نویسندگان
چکیده
We present the quantitative investigation of submicron structure in bulk porous graphite by using dark-field x-ray imaging with Hartmann masks. By scanning correlation length and measuring mask visibility reduction, we obtain average pore size, relative fraction, fractal dimension, Hurst exponent a simple flexible setup relaxed requirements on beam coherence. Profiting from dimensionality mask, scattering signals two orthogonal directions, which reveals anisotropy sizes.
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ژورنال
عنوان ژورنال: Physical review
سال: 2022
ISSN: ['0556-2813', '1538-4497', '1089-490X']
DOI: https://doi.org/10.1103/physrevb.106.144204